■ Visualization of single atomic steps on an ultra-flat Si(100) surface by advanced differential interference contrast microscopy
Shin-ichiro Kobayashi, Youn-Geun Kim, Rui Wen, Kohei Yasuda, Hirokazu Fukidome, Tomoyuki Suwa, Rihito Kuroda, Xiang Li, Akinobu Teramoto, Tadahiro Ohmi and Kingo Itaya
Electrochemical and Solid-state Letters  accepted for publication